Automated bench setup for testing H-bridges
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Characterization is an important step before integrated circuits are produced for sale. Characterizing is expensive and time consuming. This paper analyzes the methods of characterizing and proposes an alternate solution that is not as expensive as testing on an ATE and is very fast when compared to characterizing on a bench setup. The solution involves automating the testing procedure on a bench setup. The programming to control the instruments is accomplished in LabVIEW. The data from the tests are analyzed for repeatability. A cost estimate is also developed to aid in determining the ideal testing method for different requirements.