Lot-to-lot analysis of semiconductor parameter predictors
Date
2004-12
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
It is desired to predict parameters of microprocessors at an earlier stage in their life cycle. A method for predicting these parameters uses smaller circuits found on the devices that emulate how the device works. These smaller devices, theoretically, exactly the same physics as the circuits found in the functional portion of the device. This method compares the frequency of this smaller circuit to the functional frequency of the entire chip. This method is also compared to the current method of predicting these parameters to determine which is better.
Description
Keywords
Semiconductors -- Measurement, Semiconductors -- Testing