Analysis and implementation of a generic pre-laser test
Date
2002
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
The growth of semiconductor industry is dependent on delivering good products. Semiconductor memory testing is very important to deliver good products to the costumers. Prelaser testing of memory is done to rectify the defects in the memory. This paper describes the various memory tests, compares them based on the fault coverage's offered by them and implements a generic program to test memory on a semiconductor wafer.
Description
Keywords
Generic programming, Semiconductor storage devices, Semiconductor industry