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dc.creatorHwa, Taiann
dc.date.available2011-02-18T21:57:11Z
dc.date.issued1975-05
dc.identifier.urihttp://hdl.handle.net/2346/17263en_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectX-rays -- Diffractionen_US
dc.subjectSilicon crystalsen_US
dc.subjectScattering (Physics)en_US
dc.titleStudy of Borrmann scattering in silicon crystal.
dc.typeThesis
thesis.degree.nameM.S.
thesis.degree.levelMasters
thesis.degree.disciplinePhysics
thesis.degree.grantorTexas Tech University
thesis.degree.departmentPhysics
dc.degree.departmentPhysicsen_US
dc.rights.availabilityUnrestricted.


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