An approach in IC testing

Abstract

Digital testing has revolutionized the semiconductor industry. The demand for quality and reliable product enhanced the testing methods. Testing a device has many challenges. Usage of ATE (Automated Test Equipment) is a big leap in the industry decreasing the time to market pressure and increasing the reliability of the product at various stages [2]. Testing is done at various levels in design and manufacturing to enhance the product quality. An approach is discussed to test any digital IC on any tester using a generic algorithm for DC parametric and loose functional tests. This algorithm can further be extended for AC parametric test and full fledged functional tests according to the ATE capability.