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dc.creatorMettu, Niranjandas Reddy
dc.date.available2011-02-18T22:58:33Z
dc.date.issued2003-12
dc.identifier.urihttp://hdl.handle.net/2346/19189en_US
dc.description.abstractDigital testing has revolutionized the semiconductor industry. The demand for quality and reliable product enhanced the testing methods. Testing a device has many challenges. Usage of ATE (Automated Test Equipment) is a big leap in the industry decreasing the time to market pressure and increasing the reliability of the product at various stages [2]. Testing is done at various levels in design and manufacturing to enhance the product quality. An approach is discussed to test any digital IC on any tester using a generic algorithm for DC parametric and loose functional tests. This algorithm can further be extended for AC parametric test and full fledged functional tests according to the ATE capability.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectVoltmeters -- Testingen_US
dc.subjectSemiconductors -- Testingen_US
dc.titleAn approach in IC testing
dc.typeThesis
thesis.degree.nameM.S.E.E.
thesis.degree.levelMasters
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorTexas Tech University
thesis.degree.departmentElectrical and Computer Engineering
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.rights.availabilityUnrestricted.


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