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dc.creatorWu, Chwan-chia
dc.date.available2011-02-18T23:41:12Z
dc.date.issued1981-12
dc.identifier.urihttp://hdl.handle.net/2346/20395en_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectElectronic circuits -- Testingen_US
dc.subjectAutomatic test equipment (ATE)en_US
dc.subjectMaintainability (Engineering)en_US
dc.subjectElectronic apparatus and appliances -- Maintenanceen_US
dc.titleAnalog fault diagnosis with failure bounds
dc.typeDissertation
thesis.degree.namePh.D.
thesis.degree.levelDoctoral
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorTexas Tech University
thesis.degree.departmentElectrical and Computer Engineering
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.rights.availabilityUnrestricted.


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