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dc.creatorBlack, Todd A.
dc.date.available2011-02-18T23:52:59Z
dc.date.issued2000-12
dc.identifier.urihttp://hdl.handle.net/2346/20711en_US
dc.description.abstractThis paper details the design and verification of a new type of semiconductor parametric oscillator. The oscillator will be designed to incorporate a close representation of the actual critical path of the device being tested. The oscillator will allow for more accurate modeling of device speed, leading to improvements in yield analysis and material planning. The oscillator is designed for an advanced CMOS process to model a complex microprocessor.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectOscillatorsen_US
dc.subjectCritical path analysisen_US
dc.subjectElectricen_US
dc.titleA critical path based parametric ring oscillator
dc.typeThesis
thesis.degree.nameM.S.E.E.
thesis.degree.levelMasters
thesis.degree.grantorTexas Tech University
thesis.degree.departmentElectrical Engineering
dc.rights.availabilityUnrestricted.


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