A critical path based parametric ring oscillator
Date
2000-12
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
This paper details the design and verification of a new type of semiconductor parametric oscillator. The oscillator will be designed to incorporate a close representation of the actual critical path of the device being tested. The oscillator will allow for more accurate modeling of device speed, leading to improvements in yield analysis and material planning. The oscillator is designed for an advanced CMOS process to model a complex microprocessor.
Description
Keywords
Oscillators, Critical path analysis, Electric