Correlation Between Optoelectronic and Structural Properties and Epilayer Thickness of AlN

Ver/

196.pdf (233.8Kb)

Fecha

2007-06-11

Autor

Weyburne, David

Paduano, Q.S.

Jiang, H.X.

Lin, J.Y.

Li, J.

Nepal, N.

Nakarmi, M.L.

Dahal, R.

Pantha, B.N.

Metadatos

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Citable Link

http://hdl.handle.net/2346/22913

Colecciones

Center for Nanophotonics