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Correlation Between Optoelectronic and Structural Properties and Epilayer Thickness of AlN

Weyburne, David; Paduano, Q.S.; Jiang, H.X.; Lin, J.Y.; Li, J.; Nepal, N.; Nakarmi, M.L.; Dahal, R.; Pantha, B.N. (American Institute of Physics, 2007-06-11)