Search

Now showing items 1-2 of 2

Correlation Between Biaxial Stress and Free Exciton Transition in AlN Epilayers

Jiang, H.X.; Lin, J.Y.; Li, J.; Nakarmi, M.L.; Al Tahtamouni, T.M.; Nepal, N.; Pantha, B.N. (American Institute of Physics, 2007-09-20)

Correlation Between Optoelectronic and Structural Properties and Epilayer Thickness of AlN

Weyburne, David; Paduano, Q.S.; Jiang, H.X.; Lin, J.Y.; Li, J.; Nepal, N.; Nakarmi, M.L.; Dahal, R.; Pantha, B.N. (American Institute of Physics, 2007-06-11)