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Defect model for the electronic conduction and breakdown in dielectric thin films
(Texas Tech University, 1987-12)
A stochastic model of defects has been developed to explain the electronic properties of dielectric thin film systems. Consequently, a reaction-diffusion (RD) type of equation is obtained. This model considers the dielectric ...
Search for the muon-stopping sites in rare-earth orthoferites [i.e. orthoferrites] by means of dipolar calculation
(Texas Tech University, 1986-08)
The uSR data for RFe03 (R=Er, Ho, Y, Dy, Eu and Sm) indicates that three separate localized muon sites may exist. In Ref.(12) one of these sites lying in the R-0 plane of the perovskite structure was identified, hereafter ...
Search for the muon-stopping sites in rare-earth orthoferites [i.e. orthoferrites] by means of dipolar calculation
(Texas Tech University, 1986-08)
The uSR data for RFe03 (R=Er, Ho, Y, Dy, Eu and Sm) indicates that three separate localized muon sites may exist. In Ref.(12) one of these sites lying in the R-0 plane of the perovskite structure was identified, hereafter ...