1-D Fourier Ptychographic Microscopy

Fourier Ptychographic Microscopy (FPM) is a novel and promising phase-recovery imaging technique that can surpass Rayleigh resolution limit when imaging non-periodic samples. However, we show that in photonic crystal imaging applications the resolution limit of the FPM technique cannot surpass Rayleigh resolution limit. We present a comprehensive discussion of this loophole in the FPM technique and we discuss how this limitation can be overcome