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dc.creatorLedbetter, Christopher Michael
dc.date.available2011-02-18T19:04:02Z
dc.date.issued2005-12
dc.identifier.urihttp://hdl.handle.net/2346/9277en_US
dc.description.abstractDiscusses the importance of testing of integrated circuits and different testing techniques. The creation of the automated bench test setup is shown and the process to create on discussed. A specific part is picked to demonstrate an automated bench tester. The test setup, generation of the test signals, the programs required to automate the equipment, and the results are presented. LabVIEW is used to control and automate the test setup. It is an excellent at collecting, processing, and sending data.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectIC Testingen_US
dc.subjectAutomateden_US
dc.subjectLABViewen_US
dc.subjectTestingen_US
dc.titleAutomated bench setup to characterize and test integrated circuits efficiently
dc.typeThesis
thesis.degree.nameM.S.E.E.
thesis.degree.levelMasters
thesis.degree.disciplineElectrical and Computer Engineering
thesis.degree.grantorTexas Tech University
thesis.degree.departmentElectrical and Computer Engineering
dc.contributor.committeeMemberCox, Ronald H.
dc.contributor.committeeChairParten, Michael E.
dc.degree.departmentElectrical and Computer Engineeringen_US
dc.rights.availabilityUnrestricted.


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