Extremes in the distribution of micro mechanical properties in a micro electrical mechanical device
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Abstract
Texas Instruments’ DLP group forever changed projection technology and the widespread adoption of projection systems with the creation of the digital micromirror device. The DMD can now be found enabling projection systems for many different applications, from movie theatres to classrooms, all across the world. Due to the unique characteristics of the DMD and demanding applications in which it is used, the DLP group has devised equally unique testing methods for ensuring robust and desirable operation of the DMD that meets the high standards expected in today’s technology. As production volumes dramatically increase with smaller, more cost effective devices, the challenge of ensuring optimal use of testing resources has once again become a point of focus for the DPL group. The investigation outlined in this thesis is based on the motivation of optimizing testing efficiency through the development of new testing methodologies based on results from modeling the behavior of components within the DMD array.