Automated bench setup to characterize and test integrated circuits efficiently
Date
2005-12
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
Discusses the importance of testing of integrated circuits and different testing techniques. The creation of the automated bench test setup is shown and the process to create on discussed. A specific part is picked to demonstrate an automated bench tester. The test setup, generation of the test signals, the programs required to automate the equipment, and the results are presented. LabVIEW is used to control and automate the test setup. It is an excellent at collecting, processing, and sending data.
Description
Rights
Rights Availability
Unrestricted.
Keywords
IC Testing, Automated, LABView, Testing