AC measurements using a built in self test

Date

2006-12

Journal Title

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Volume Title

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Abstract

Microprocessors are designed in order to interface with other processors or components at speeds that are constantly increasing. This speed increase is a desired effect in the semiconductor industry, as it opens the world to more computing power within compact technologies, including cell phones, gaming systems and super computers. The implementation of these technologies is desired by consumers, as they give quick access to information. However, this poses specific problems to suppliers of these Integrated Circuits. In order for these microprocessors to be of any use to the consumers, they must fall within the bounds of desired specifications that will best describe their behavior. The ability to guarantee these specifications for every device before being introduced into the market becomes difficult and expensive at the speeds desired at present and in the future.

Description

Rights

Availability

Unrestricted.

Keywords

Setup time, Propagation delay, Alternating current (AC), External memory interfaces (EMIF), Perioheral component interconnect (PCI), Built in self test (BIST)

Citation