VLSI memory tester pin electronics system

Date

1990-05

Journal Title

Journal ISSN

Volume Title

Publisher

Texas Tech University

Abstract

In recent years, advances in the design and manufacture of integrated circuits have allowed the varieties and numbers of the devices to increase as never before. The rate of production of new and more sophisticated devices has been accelerated through the use of computer-aided design and manufacturing practices. Decreases in the time required to take a new design from the drawing board to a final product have proved beneficial to semiconductor manufacturers, but those companies must also be able to guarantee the operation of the devices they produce. The production of semiconductor devices involves a variety of sophisticated processes and verifying the operation of the final product can prove to be quite challenging.

Description

Keywords

Integrated circuits -- Very large scale integration, Computer storage devices -- Testing

Citation