Dielectric optical notch filter at 1.55 micrometers
Date
1999-05
Authors
Journal Title
Journal ISSN
Volume Title
Publisher
Texas Tech University
Abstract
All-dielectric optical notch filters centered at 1.55 µm has been constructed, tested and analyzed. Optical notch filter design considerations such as choice of dielectric material pair, best structure of filters will be discussed. The actual optical notch filters show some absorption at 1.55 µm. Special single Si and Si02 layers have been deposited in the same deposition condition as that for the construction of optical notch filters. Material analysis including absorption analysis has been done to figure out why optical notch filters show absorption and where absorption come from.
Description
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Availability
Unrestricted.
Keywords
Dielectric measurements, Thin films -- Optical properties, Fabry-Perot interferometers, Dielectric devices