Silicon-Dioxide Waveguides With Low Birefringence
Date
2003-07
Authors
Doucette, David
Borhani, Marcus
Temkin, H.
Bernussi, Ayerton
Grave de Peralta, L.
Journal Title
Journal ISSN
Volume Title
Publisher
IEEE
Abstract
We describe the use of highly boron-doped silicon dioxide for the preparation of optical waveguides with very low birefringence. Plasma-enhanced chemical vapor deposition was used to vary the boron content from 5 wt% to 10 wt%, at a constant phosphorus content of 4.8%. A transition from compressive to tensile stress was observed at a boron concentration of 9.1%. Pedestal-type waveguides formed with the high-boron top cladding layer show low loss of 0.02 dB/cm. Arrayed waveguide grating devices with a polarization-dependent wavelength shift of 0.01 nm and excellent stability have been demonstrated.
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Citation
de Peralta, L.G.; Bernussi, A.A.; Temkin, H.; Borhani, M.M.; Doucette, D.E.; , "Silicon-dioxide waveguides with low birefringence," Quantum Electronics, IEEE Journal of , vol.39, no.7, pp. 874- 879, July 2003 doi: 10.1109/JQE.2003.813194