Correlation Between Optoelectronic and Structural Properties and Epilayer Thickness of AlN
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Date
2007-06-11
Authors
Weyburne, David
Paduano, Q.S.
Jiang, H.X.
Lin, J.Y.
Li, J.
Nepal, N.
Nakarmi, M.L.
Dahal, R.
Pantha, B.N.
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Publisher
American Institute of Physics