Evaluation of GaN HEMTs in H3TRB Reliability Testing

dc.creatorRodriguez, Jose A. (TTU)
dc.creatorTsoi, Tsz (TTU)
dc.creatorGraves, David (TTU)
dc.creatorBayne, Stephen B. (TTU)
dc.date.accessioned2023-04-05T18:23:30Z
dc.date.available2023-04-05T18:23:30Z
dc.date.issued2022
dc.description© 2022 by the authors. Licensee MDPI, Basel, Switzerland. cc-by
dc.description.abstractGallium Nitride (GaN) power devices can offer better switching performance and higher efficiency than Silicon Carbide (SiC) and Silicon (Si) devices in power electronics applications. GaN has extensively been incorporated in electric vehicle charging stations and power supplies, subjected to harsh environmental conditions. Many reliability studies evaluate GaN power devices through thermal stresses during current conduction or pulsing, with a few focusing on high blocking voltage and high humidity. This paper compares GaN-on-Si High-Electron-Mobility Transistors (HEMT) device characteristics under a High Humidity, High Temperature, Reverse Bias (H3TRB) Test. Twenty-one devices from three manufacturers were subjected to 85◦C and 85% relative humidity while blocking 80% of their voltage rating. Devices from two manufacturers utilize a cascade configuration with a silicon metal-oxide-semiconductor field-effect transistor (MOSFET), while the devices from the third manufacturer are lateral p-GaN HEMTs. Through characterization, three sample devices have exhibited degraded blocking voltage capability. The results of the H3TRB test and potential causes of the failure mode are discussed.
dc.identifier.citationRodriguez, J.A., Tsoi, T., Graves, D., & Bayne, S.B.. 2022. Evaluation of GaN HEMTs in H3TRB Reliability Testing. Electronics (Switzerland), 11(10). https://doi.org/10.3390/electronics11101532
dc.identifier.urihttps://doi.org/10.3390/electronics11101532
dc.identifier.urihttps://hdl.handle.net/2346/92530
dc.language.isoeng
dc.subjectpower electronics
dc.subjectreliability
dc.subjectwide-bandgap
dc.titleEvaluation of GaN HEMTs in H3TRB Reliability Testing
dc.typeArticle

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Main article with TTU Libraries cover page.pdf
Size:
10.32 MB
Format:
Adobe Portable Document Format

Collections