Characterization of AlN Metal-Semiconductor-Metal Diodes in the Spectral Range of 44-360 Nanometer: Photoemission Assessments

Date

2008-01-15

Authors

Richter, M.
Kroth, U.
De Jaeger, J.C.
Soltani, A.
Jiang, H.X.
Lin, J.Y.
Li, J.
Dahal, R.
Hochedez, J.F.
BenMoussa, A.

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Publisher

American Institute of Physics

Abstract

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