Advanced modular testing methods for integrated circuits

Date
2015-05
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Abstract

The Program for Semiconductor and Product Engineering (PSPE) at Texas Tech University strives to prepare students for a job in the semiconductor field. One crucial partner with PSPE is National Instruments (NI) who has donated a state of the art Automated Test Equipment (ATE) called the Semiconductor Test System (STS). This thesis discusses the development of curriculum for ECE 5332: Advanced Modular Testing Methods for Integrated Circuits, which focuses on training students how to properly utilize the STS foe their own projects

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Keywords
Semiconductor, Test Engineering, Electrical Engineering, Curriculum
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