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dc.creatorCheng, Shih King
dc.date.available2011-02-18T22:18:07Z
dc.date.issued1980-05
dc.identifier.urihttp://hdl.handle.net/2346/17946en_US
dc.description.abstractNot available
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.publisherTexas Tech Universityen_US
dc.subjectX-rays -- Scatteringen_US
dc.subjectMetallic films -- Optical propertiesen_US
dc.subjectReflection (Optics)en_US
dc.titleStudy of metal films by the method of total reflection of x-rays
dc.typeDissertation
thesis.degree.namePh.D.
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorTexas Tech University
thesis.degree.departmentPhysics
dc.degree.departmentPhysicsen_US
dc.rights.availabilityUnrestricted.


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