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dc.creatorSen, Sanchari
dc.date.accessioned2016-06-27T22:25:39Z
dc.date.available2016-06-27T22:25:39Z
dc.date.created2016-05
dc.date.issued2016-05
dc.date.submittedMay 2016
dc.identifier.urihttp://hdl.handle.net/2346/67154
dc.description.abstractIn this work an Electronically Controlled hemi-spherical Condenser (ECC) both in visible and near infra-red spectrum is presented for the first time. This condenser has many advantages over its counterparts. It was used to implement several super-resolution techniques such as, Fourier Plane Imaging Microscopy (FPIM), Fourier Ptychographic Microscopy (FPM) and Dual Space Microscopy (DSM). The unprecedented work of using FPM to image photonic crystals was done and it was found that for a single periodicity the method fails to go below the Rayleigh resolution limit. FPM, which is a relatively new technique, is also implemented outside the visible spectrum for the first time. On the other hand, DSM was introduced in this work, where the resolution barrier can be crossed for photonic crystals.
dc.format.mimetypeapplication/pdf
dc.language.isoeng
dc.subjectResolution Microscopy
dc.titleElectronically controlled hemi-spherical condensers
dc.typeThesis
dc.date.updated2016-06-27T22:25:39Z
dc.type.materialtext
thesis.degree.nameDoctor of Philosophy
thesis.degree.levelDoctoral
thesis.degree.disciplinePhysics
thesis.degree.grantorTexas Tech University
thesis.degree.departmentPhysics
dc.contributor.committeeMemberBernussi, Ayrton A.
dc.contributor.committeeMemberSanati, Mahdi
dc.contributor.committeeMemberMyles, Charley
dc.contributor.committeeChairPeralta, Luis G.
dc.rights.availabilityUnrestricted.
dc.creator.orcid0000-0002-5456-283X


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