Study of thin films using x-rays

Date

2002-12

Journal Title

Journal ISSN

Volume Title

Publisher

Texas Tech University

Abstract

This thesis describes the experimental methods employed for the study of thin films grown by Molecular Beam Epitaxy (MBE) or using deposition processes like ebeam evaporation by x-ray diffraction and reflectivity. In chapter-1 I briefly describe the source and generation of x-rays and how they can be employed for the study. In chapter-2 I deal with the physics of diffraction, the various laws that govern the phenomena and the factors affecting it. In the subsequent I deal with the three kinds of measurement namely powder diffi-action, High Angle x-ray Diffi-action (HAXRD) and finally the Glancing Incidence x-ray Reflectivity (GIXR). For each method I describe and illustrate the parameters that can be evaluated from the respective measurements.

All the measurements have been done using X-PERT, an x-ray diffraction machine from Philips at Jack Maddox Laboratory- Texas Tech University.

Description

Keywords

X-rays, Thin films

Citation