An approach in IC testing

Date

2003-12

Journal Title

Journal ISSN

Volume Title

Publisher

Texas Tech University

Abstract

Digital testing has revolutionized the semiconductor industry. The demand for quality and reliable product enhanced the testing methods. Testing a device has many challenges. Usage of ATE (Automated Test Equipment) is a big leap in the industry decreasing the time to market pressure and increasing the reliability of the product at various stages [2]. Testing is done at various levels in design and manufacturing to enhance the product quality. An approach is discussed to test any digital IC on any tester using a generic algorithm for DC parametric and loose functional tests. This algorithm can further be extended for AC parametric test and full fledged functional tests according to the ATE capability.

Description

Keywords

Voltmeters -- Testing, Semiconductors -- Testing

Citation