An approach in IC testing
Date
2003-12
Authors
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Journal ISSN
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Publisher
Texas Tech University
Abstract
Digital testing has revolutionized the semiconductor industry. The demand for quality and reliable product enhanced the testing methods. Testing a device has many challenges. Usage of ATE (Automated Test Equipment) is a big leap in the industry decreasing the time to market pressure and increasing the reliability of the product at various stages [2]. Testing is done at various levels in design and manufacturing to enhance the product quality. An approach is discussed to test any digital IC on any tester using a generic algorithm for DC parametric and loose functional tests. This algorithm can further be extended for AC parametric test and full fledged functional tests according to the ATE capability.
Description
Keywords
Voltmeters -- Testing, Semiconductors -- Testing